Used RUDOLPH FE VII #9236829 for sale

RUDOLPH FE VII is a fast and precise tool for measuring thin film optical properties. It is an automated, multiple wavelength ellipsometer used to measure the complex optical properties of thin films or multilayers. Based on the principles of ellipsometry, RUDOLPH FEVII uses polarized light to measure the changes in light polarization after reflecting off a sample surface. Through this approach, optical characteristic such as gas layer thickness, film thickness, refractive index and extinction coefficients can be measured. FE-VII also allows multi-wavelength measurements from 190nm to 1050nm. This instrument is easy to use, providing fast, accurate, and repeatable measurements on a variety of sample sizes. It is available with a high repetition rate for quality control applications, or with a lower rate for more precise measurements. FE VII also offers a variety of software packages that further simplify operation. RUDOLPH FE-VII is composed of the following main components: a light source, a detection equipment, a variable angle of incidence optics, and a computer control system. The light source is a 150W Xenon flasha lamp with a g-line filter for stable and repeatable measurements across a wide range of wavelengths. This light source allows researchers to measure multiple samples over a wide range of wavelength ranges in a short amount of time. The detection unit consists of a CCD camera detector and a filter wheel. The camera records the data for the analysis, while the filter wheel allows the wavelengths of light to be selected. The variable angle of incidence optics are designed to reduce the impact of false readings due to light reflecting off of other surfaces or off-axis angles. The two main components are a motorized linear stage and an optical detector. The linear stage allows sample rotation angle to be adjusted. The optical detector senses the polarization of the reflected light, and adjusts the angle of incidence so that the light is evenly reflected off the sample surface. The computer control machine provides an interface for operating FEVII and also includes a variety of software packages that assist the user with data processing, reporting and analysis. RUDOLPH FE VII is an advanced, versatile tool for measuring thin film properties. It provides fast, accurate and repeatable results for a variety of sample sizes, making it an ideal choice for thin film optical properties research.