Used RUDOLPH FE VII #9306017 for sale

RUDOLPH FE VII is an advanced ellipsometer developed by RUDOLPH Technologies Inc. It supports a wide range of measurements from nano- to micron level and can be used to measure a variety of materials including metals, polymers, composites, and semiconductors. The instrument features patented, interference-free, imaging-based polarimetry measurement technology that allows users to acquire high accuracy and repeatable results in minutes. The advanced imaging-based polarization modulation technique eliminates the need for traditional optical components such as half-wave plates and compensator plates, allowing the use of a more efficient and compact optical configuration. RUDOLPH FEVII supports two instruments, an Observer and a Profiler. The Observer model is used to analyze thin films and is capable of generating accurate results up to 4 nanometers in thickness. The Profiler model is used for skin analysis and can measure the surface features of paints, coatings, and other materials to an even finer level of accuracy. The system operates under a highly automated setup using a Windows based interface, eliminating the need for manual intervention. It incorporates data acquisition and analysis software, as well as a user interface for controlling the processes. The system also includes a graphical thumbnail view of the incident light, allowing the user to easily select the correct band of incident light wavelengths that would yield the most accurate results. FE-VII is an invaluable tool for research and development and production of thin films and surface studies. It provides accurate results in minutes and is easy to use with its Windows interface. The device eliminates the need for optical components, as well as tedious manual labor, and provides high accuracy and repeatable results.