Used RUDOLPH FE VII #9355413 for sale

RUDOLPH FE VII is a high-precision, automated optical ellipsometer specifically designed for the measurement of inorganic and organic materials with thicknesses ranging from 0.1 - 1000 μm. Using the principles of multiple-beam interference and ellipsometry, the equipment is able to measure ultra-thin films and other microstructures with sub-micrometre accuracy. RUDOLPH FEVII is equipped with an advanced phase modulator and adjustable polarizing element, which allows the system to measure materials with varying thickness and optical properties. The modular design makes it possible to customize FE-VII so that it can be used to analyze a variety of samples, including polarizability, dielectric constants, birefringence, stress, and film-deposited materials. FEVII features an integrated spectrometer for authentication purposes, allowing for the confirmation of the optical properties of materials. The unit also includes a high-resolution monitor displaying real-time measurements and data from experiments. The touch-screen user interface allows for quick and easy operation, making it ideal for experimental and research applications. RUDOLPH FE-VII has a wide range of features and capabilities that are suitable for a variety of applications. These features include: ultra-precision mechanical actuators for adjusting polarizers and sample geometry; sub-micrometre measurements with confirmations; data sampling speeds of up to 15 kHz; and a built-in processing unit that can store up to 15,000 measurement files. Additionally, the machine is also capable of measuring a variety of optical materials and chemicals, including metals, dielectrics, and ceramics. FE VII provides a fast, reliable, and accurate way to measure the optical properties of materials. The tool is widely used in the research and development of new materials and products, as well as for quality control in the production of existing materials and products. As a result, it is commonly used for applications such as semiconductor layer thickness measurements, device testing and characterization, and ultra-thin film deposition. For added convenience, RUDOLPH FE VII is compatible with the Robolift family of automated sample loading systems. These systems allow the asset to be operated remotely, providing a cost-effective and reliable alternative to manual sample loading. Furthermore, the model is also compatible with the Robomaker software package, which can be used to automate advanced measurement and process applications.