Used RUDOLPH FE VII #9397723 for sale

RUDOLPH FE VII is an advanced ellipsometer designed for precise measurements of thin film optical properties. An ellipsometer, such as RUDOLPH FEVII, works by simultaneously measuring the phase and amplitude of light reflected off the surface of a sample, generally film or coating. By measuring the intensity and polarization of the reflected light, FE-VII can determine the optical properties of films and coatings, including thickness, refractive index and extinction coefficient. FEVII features a high-resolution imaging ellipsometer and a digital scan controller, allowing it to accurately measure films down to 50nm in thickness. The ellipsometer is also able to be configured for custom film applications and can adjust to use all popular polarization states, with up to four detectors per state. It is also capable of selecting up to ten wavelengths simultaneously, making it a useful tool for wavelength-dependent measurements. In addition to high accuracy, RUDOLPH FE-VII is capable of fast scanning speeds with a scanning speed of 1000 measurements/second. This helps shorten testing times while still providing accurate results. The system also contains an 8-bit, 356 x 262 pixel cooled CCD array detector with a noise level of 0.05%, and a slatted mirror accessory for angular resolution as low as 0.2°. The analytical capabilities of FE VII are enhanced by the built-in SUNYSide® software, which provides foolproof operation and automated data processing for complex films. It also allows for a wide range of data analysis, such as curve fitting, wavelength filtering and TFCalc real time calculations. Overall, RUDOLPH FE VII is an extremely accurate and reliable ellipsometer capable of measuring a variety of thin film optical properties, making it an ideal choice for applications that require precision and speed.