Used RUDOLPH FOCUS FE III #9188629 for sale

RUDOLPH FOCUS FE III is an ellipsometer manufactured by RUDOLPH Technologies. It is a high-precision device used to measure thin-film thickness and optical constants such as refractive index and extinction coefficient. It uses a combination of polarized light reflection off a sample and ellipsometry to measure and analyze these materials with better precision. FOCUS FE III ellipsometer is an instrument which utilizes the combined theory of polarized light reflection and ellipsometry for high-precision measurements. This device includes a light source, a light modulator, a sample stage, a polarization controller, and optical and electronic detectors. The beam of polarized light is generated by the light source and is modulated by a rotating half-wave plate. The light is then reflected off the sample and detected by the detectors and analyzed by the polarization controller. Polarized light is used because it can provide more information than unpolarized light when analyzing thin films. The sample stage is used to position and mount the sample. An infrared beam and laser sensors are used here to detect sample positions and adjust the optical path accordingly. This allows RUDOLPH FOCUS FE III to accurately measure the angle of incidence and polarization modulation. The polarization controller is an optical device that filters, adjusts, and measures the polarization of the light beam. It uses a quarter-wave plate and an analyzer to measure the state of polarization of the reflected light. The optical and electronic detectors measure the effect the sample has on the polarized light. This information is used by the optical portion of the instrument to determine measurements such as film thickness, refractive index, and extinction coefficient. Overall, FOCUS FE III is a highly precise and accurate device used to measure thin-film thickness and optical constants such as refractive index and extinction coefficient. With its combination of polarized light reflection and ellipsometry, it can quickly and accurately measure thin films with excellent precision.