Used RUDOLPH NIR 3 #9199611 for sale

RUDOLPH NIR 3 is an ellipsometer that is designed to measure the thickness and optical constants of multilayer films. It has improved features compared to the previous version (RUDOLPH NIR 2) which include a new near-infrared (NIR) detector, improved measurement range and increased accuracy. RUDOLPH NIR-3 uses a pulsed laser beam, consisting of light waves with a predetermined wavelength, which is directed onto the sample. The light then interacts with the sample surface and some of it is reflected back towards the detector for analysis. The instrument measures the change in polarization of the incident light and the angle of the reflected light beam, which occurs due to the different thickness and optical constants of the multilayer films. The optical parameters - the optical properties that characterize the material - can be determined from the measured polarization and angle. This allows the thickness and optical constants of the films to be determined to an unprecedented level of accuracy. The instrument has a wide measuring range and it can measure both the thickness and optical constants of up to 14 layers of dielectric or metallic samples with very high accuracy and very low uncertainty. It can measure up to 2000 Ångström in thickness and it can be used to analyse films ranging in thickness from 1nm up to 300µm. The user interface software of NIR 3 has been designed for easy use and it includes advanced features such as automated batch measurements, customizable report templates and graphical data displays. In short, NIR-3 is an advanced ellipsometer which provides accurate measurements of the thickness and optical constants of samples with very high accuracy. It has a wide measuring range and it is easy to use. This makes it a great choice for characterizing films in a wide variety of research and industrial applications.