Used RUDOLPH S 300 #9257404 for sale

RUDOLPH S 300 is an advanced ellipsometer for thin film metrology. Ellipsometry is a non-destructive technology used to measure the thickness and optical properties of thin films. It involves measuring reflected light off a sample, and from that, it can measure information about film layers, such as thickness, refractive index, and extinction coefficient. RUDOLPH S300 is an ellipsometer designed to measure thin films, ranging from 1 to several hundred nanometers, with high accuracy and precision. It's equipped with three types of incident light sources for broad wavelength coverage: a xenon arc lamp, a tungsten-halogen lamp, and a supercontinuum laser. It also has a CCD camera coupled with a precise monochromator for fast and accurate measurements over a broad spectral range. S-300 uses a patented sample stage, which uses a combination of mechanical, air, and vacuum components for highly accurate movements of the sample. It also has a pneumatic tilt motor and two precision mechanics to enable precise measurements of the angle of incidence. The ellipsometer is equipped with an open-source software package, allowing users to customize the software to their specific needs. It also comes with RUDOLPH Research Analyzer, which allows users to interface with the hardware and the software, as well as to perform powerful data analysis. Given its broad wavelength coverage, precision mechanics, and open-source software, RUDOLPH S-300 is an ideal choice for research and development organizations that require reliable thin film measurements. Its accurate, high-precision measurements, and ability to customize the software make it an ideal choice for a variety of thin film metrology applications.