Used RUDOLPH S3000A #293639195 for sale

RUDOLPH S3000A
Manufacturer
RUDOLPH
Model
S3000A
ID: 293639195
Wafer Size: 12"
Thickness measurement system, 12".
RUDOLPH S3000A is an advanced ellipsometer designed for research laboratories and universities. This state-of-the-art optical characterization tool offers easy to read display, high accuracy, and a wide range of usage options. RUDOLPH S 3000 A is a state-of-the-art ellipsometer designed for research laboratories, universities and industrial applications. An ellipsometer is an optical characterization tool for determining the thickness, refractive index and birefringence of thin films. S3000A utilizes a HeNe laser source with 635nm wavelength and 12mW output, which is focused on the sample with the purpose of measuring the change in the polarization state of the light. Two detectors are used to measure the change in light intensity and phase angle of the light. S 3000 A offers a range of usage options with a variety of measurement techniques for thin film studies. These include variable angle ellipsometry, multiple wavelength analysis, film stress analysis, spectral ellipsometry, as well as more specialized techniques such as Mueller matrix and anisotropy ellipsometry. RUDOLPH S3000A features an easy to read color LCD display with a graphical user interface allowing intuitive measurement and analysis of the thin film samples. This allows easy control of the system and data collection. Additionally, RUDOLPH S 3000 A features ultra-high accuracy of 0.05 nm and 0.01 degrees, as well as speedy data collection with a 15 degree simultaneous scan rate. S3000A is incredibly versatile and is well suited to a range of applications. It is ideal for materials characterization, semiconductor testing, optical coating and thin film research. The unit is compatible with a range of accessories for expanded usage - such as probe head, mask changer and rotation stage. S 3000 A is an advanced ellipsometer designed for research and industrial applications. This state-of-the-art tool offers an easy to read display, high accuracy and a wide range of usage options. With its variable angle measurement techniques, ultra-high accuracy and wide compatibility, RUDOLPH S3000A is an ideal choice for thin film research, optical coating and materials characterization.
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