Used RUDOLPH S3000A #9244823 for sale

RUDOLPH S3000A is a high performance ellipsometer designed for thin film characterization and material analysis. Ellipsometry is a non-destructive optical technique used to measure a film's thickness and optical constants such as refractive index, extinction coefficient, and absorption coefficient. It employs a polarization-modulated laser beam directed onto the sample and reflects it back to a detector. Depending on the composition and thickness of the film, the relative intensity of the reflected light is changed. By altering the light's polarization, the film's characteristics can be determined. RUDOLPH S 3000 A ellipsometer contains an integrated polarimeter which employs up to four wavelengths of laser light, including 405 nm, 633 nm, 785 nm, and 1064 nm, for film characterization and material research. The laser light is combined with additional modulated light to allow for greater accuracy and measurement capabilities. S3000A also includes a unique linear and circular polarizer configuration, which enables measuring in both TE (transverse electric) and TM (transverse magnetic) circular polarization. This enables measurement of all film optical properties, including birefringence, phase retardation, and optical constants such as index of refraction (n) and extinction coefficient (k). S 3000 A also includes an Automated Data Collection module, which automates the collection of data points in order to analyze and understand the sample's behavior and compare it to an established model or standard. The Automated Data Collection system also permits data collection to obtain repeatable, rapid, and accurate results. Additionally, RUDOLPH S3000A's special Computer Operated Spectroscopic Ellipsometer (COSE) design enables a higher degree of control within a single apparatus. COSE is capable of full detector scans over a wide range of incidence angles (from 10 to 90 degrees). This allows for mapping of multiple sample points for greater accuracy. Through its precision linear stages, RUDOLPH S 3000 A can also produce highly accurate measurements over a broad range of sample sizes. S3000A is ideal for performing research and development of materials and thin films used in a variety of applications, from high-resolution optical components and microchips to chemical and cosmetic coatings. It enables accurate analysis and characterization, resulting in reliable and reproducible results.