Used RUDOLPH S3000A #9311178 for sale

RUDOLPH S3000A Ellipsometer is a non-invasive, opto-electronic instrument used for measuring the thickness, refractive index, optical constants and other material properties of thin films. Its main function is to provide a highly-accurate description of the surface layer of a sample. The Ellipsometer works by measuring the changes in light intensity that occur along a polarized beam as it reflects off the sample surface layer. The reflected intensity is measured at different angles and the reflected light data is then processed with a dedicated software suite to determine surface layer thickness, refractive index, optical constants and other material properties. RUDOLPH S 3000 A utilizes a 532nm wavelength and is integrated with an Uninterrupted 360° XYZ measurement stage. This allows for mapping capability with up to 24 relays to determine the thickness, uniformity and refractive index of many different sample types. The high-resolution imaging camera facilitates alignment and surface oxide layer imaging. The simple user interface allows for routine process control and quality monitoring. S3000A boasts a refractive index and layer thickness accuracy of 3nm and 3mrad, respectively. This extreme accuracy makes S 3000 A a desirable instrument for many applications including thin film deposition verification, optical filter characterization, semiconductor film development and many other diverse fields of research. Beyond the standard barebone capabilities, RUDOLPH S3000A features additional options for optimizing and fine-tuning the alignment and operation of the instrument. It also includes a suite of tailored software solutions and applications to support all operations and requirements. In summary, RUDOLPH S 3000 A Ellipsometer represents a highly-accurate and versatile instrument for measuring the second layer of a sample. Its integrated user interface and tailored software suite make it an excellent choice for any research environment where accuracy and repeatability in the measurement of thin film materials is paramount.