Used RUDOLPH S3000A #9389594 for sale

RUDOLPH S3000A Ellipsometer is a universal, multi-wavelength optical measurement equipment designed for inspecting thin-film stacks on semiconductor wafers. The system has been developed to measure both full-field and localized optical parameters. It provides reliable, repeatable measurements with high accuracy and repeatability. RUDOLPH S 3000 A contains a light source, optical collection optics, and a four-quadrant photodiode detector to measure the complex optical response of the sample. This technique is known as Ellipsometry. The unit is capable of measuring the Full Width Half Maximum (FWHM) of the polarization-independent, transmission and reflection spectra of the sample with a wavelength range from 350-215nm. S3000A utilizes a spinning-polarizer head that contains over 7000 optical components that modulate the light, allowing the user to measure the changes in the light's intensity and polarization. The machine also contains an integrated calibration routine that ensures an accurate and repeatable reading. S 3000 A incorporates a comprehensive suite of software packages that combine powerful analysis and data processing capabilities. Using its software, RUDOLPH S3000A can quickly and accurately analyze thin films. Users can save data to an internal memory or an external data storage device. The analysis reports can then be easily transferred to a computer for further examination. RUDOLPH S 3000 A is suitable for a variety of applications and is an invaluable tool in the semiconductor industry. It is well-suited for characterization of thin-film stacks such as oxides, nitrides, and metals. The tool allows users to create detailed analysis reports that are useful for optimizing device parameters. S3000A is easy to setup, operate, and maintain. It is reliable, with a low-maintenence operation life. Highly accurate and repeatable performance make S 3000 A an exceptional choice for characterization of thin-film stacks. For all its capabilities, RUDOLPH S3000A is a cost-effective solution for conducting ellipsometry measurements.