Used RUDOLPH S3000A #9389601 for sale

RUDOLPH S3000A Ellipsometer is an automated, computer-controlled optical instrument used to measure the thickness, optical constants, and stress of thin films. It can also be used to calculate the refractive indices of films. RUDOLPH S 3000 A Ellipsometer can measure samples from a multitude of substrates such as organic and inorganic films on glass, metal, ceramic, or other surfaces. S3000A employs spectroscopic ellipsometry, a technique which measures changes in polarization of light reflected off of a sample surface. The spectroscopic ellipsometer uses a broadband light source and a grating monochromator to measure a wide range of wavelengths, from the visible to the infrared. S 3000 A also utilizes a visible rotating compensator to measure incident and reflected light signals. The visible rotator applies incident elliptically polarized light to a sample surface and measures the change in polarization of the reflected light. The compensator is controlled by an angle encoder that monitors the rotation angle and compensates for any errors (caused by environmental changes or temperature fluctuations). RUDOLPH S3000A can measure a number of parameters, including layer thicknesses, optical constants, stress, optical anisotropy (tilt and azimuth angles), and refractive indices. The system is equipped to perform mapping studies, allowing multiple points to be measured and analyzed simultaneously. RUDOLPH S 3000 A can also measure a range of sample sizes, from micro- and nano-scaled samples that are as small as 50 nanometers. S3000A also utilizes an intuitive user interface that is compatible with a wide range of Windows operating systems. This user interface includes an online help system that assists users in measure setup, data acquisition, and data analysis. Additionally, the system features a library of over 100 thin film models, making it easy to analyze sample data. Overall, S 3000 A Ellipsometer is an automated, computer-controlled instrument that provides users with accurate measurements of film thickness, optical constants, stress, and refractive indices. Its intuitive user interface and the ability to simultaneously measure multiple sample points makes it an ideal choice for those interested in studying thin films.