Used RUDOLPH S3000A #9389616 for sale
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ID: 9389616
Wafer Size: 12"
Vintage: 2010
Thickness measurement system, 12"
Focused Beam Laser Ellipsometry (FBE)
2010 vintage.
RUDOLPH S3000A Ellipsometer is an advanced research instrument for measuring the optical properties of thin films and microscopy samples. It combines the latest advances in digital technology, optical modeling, and data processing operations to provide rapid, accurate, and repeatable results. RUDOLPH S 3000 A's design consists of a unique pneumatically stabilized optical head that is driven by stepper motors to provide an extremely stable, robust platform on which optical measurements can be made. The head houses a three-axis motorized stage, a high-quality optics package, and a range of illumination, detection, and detector electronics. This makes it ideal for applications such as surface characterization, film thickness, refractive index, absorption analysis, photovoltaic cell studies, and more. S3000A delivers highly accurate wavelength-dependent analysis with ultra-low error rates. It incorporates a variety of filters that can ensure highly reliable measurements over a wide range of wavelengths and spectral responses. Additionally, it can also be integrated with its highly sophisticated software, which supports integrated spectroscopic modeling - making it ideal for advanced substrate characterization. S 3000 A's digital capabilities provide unparalleled precision and sophisticated operation. Its software-guided measurements make it ideal for automated operation, allowing users to quickly and consistently collect the data they need. It also supports a broad range of digital and analog output formats, allowing users to integrate it with other data processing systems and peripheral devices. RUDOLPH S3000A Ellipsometer is an ideal choice for researchers who need a reliable and accurate optical measurement tool. With its unique and advanced features, it can provide repeatable measurements and highly reliable results in a variety of applications.
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