Used RUDOLPH S3000A #9389617 for sale
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ID: 9389617
Wafer Size: 12"
Vintage: 2011
Thickness measurement system, 12"
Focused Beam Laser Ellipsometry (FBE)
2011 vintage.
RUDOLPH S3000A Ellipsometer is an advanced, cost-effective, and reliable optical measurement equipment used to characterize thin films and surfaces. This non-destructive, non-contact device measures the change in the polarization state of light as it passes through or reflects off the surface being analyzed. It provides measurements of film thickness and optical properties, such as refractive index and concentration, with unmatched precision and accuracy. RUDOLPH S 3000 A includes a turning-table design to allow for rapid measurement of multiple sample regions. Mounted on an underslung arm, the mounted system enables users to collect sample data more quickly and with greater ease. Specialized software gives users the ability to think of their own shows, which are pre-programmed to perform measurements on multiple samples in multiple locations. S3000A also allows measurements of anisotropic thin films, such as those made of various types of polymers and dielectrics. It is equipped with a powerful scattered light beam, allowing it to measure films as thin as 5 nanometers. An optional U cell accessory is available for even more precise measurements, from 0.5 nanometers up to 5 nanometers. S 3000 A has a user-friendly graphical interface, giving users the ability to quickly master the unit and perform repetition measurements without requiring extensive training. It also features multi-region, multi-solution reference-sample analysis, allowing it to make agnostic measurements of complex thin films and surfaces from any type of regular or irregular shape. The durability and robustness of RUDOLPH S3000A has been proven in years of service even in harsh conditions. Every machine is made to exacting tolerances to ensure stability, and the reliability of the tool is the number one priority of RUDOLPH Technologies. It is designed to withstand mechanical and thermal extremes, as well as stress and abuse. Finally, RUDOLPH S 3000 A has been proven to be an invaluable tool in the study and development of state-of-the-art materials, from large scale components to small devices at the nanoscale level. It is the perfect choice for optical and material characterization needs, and its competitive price makes it an ideal choice for manufacturers, universities, research institutes, and any other laboratory setting.
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