Used RUDOLPH S3000S #9122476 for sale

RUDOLPH S3000S is a versatile and user-friendly ellipsometer. Ellipsometers measure the change of polarization state of a light beam after reflection or transmission from a sample surface. This information can be used to measure the thickness of various thin films as well as determine the refractive index, extinction coefficient, and the surface morphology of a sample. RUDOLPH S 3000 S is an optical ellipsometer, which works by illuminating the sample surface with very low intensity, monochromatic polarized light, and measuring the change in polarization while the light is reflected back. This light is split into four channels before and after interaction with the sample. By comparing the simulated theoretical predictions with the measured polarization state, the film properties can be accurately determined. S3000S also includes the patented Fast Kinetics Utility, allowing multi-angle measurements on fast-changing film systems with only one measurement setup. S 3000 S is capable of simultaneous measurement of multiple film parameters including thickness, refractive index, optical anisotropy, absorption coefficient, and the surface morphology of the sample. It can confidently measure films as thin as a few angstroms and a wide range of sample sizes. RUDOLPH S3000S can accommodate samples with multiple layers of diffractive and refractive optical materials to achieve information on the entire structure. RUDOLPH S 3000 S utilizes a variable angle rotating polarizer and the PD-SQuaRe control and analysis module, allowing for independent adjustment of the angle and polarization. S3000S is also equipped with automated drift and background correction for faster, more reliable data collection and higher data accuracy. Additionally, S 3000 S supports both reflection and transmission ellipsometry, allowing for a wider range of applications compared to other comparable systems. RUDOLPH S3000S is a powerful, yet user-friendly tool designed to measure and analyze a wide variety of thin film samples. It is capable of providing the highest accuracy and precision of data with its proprietary optics, variable angle rotating polarizer, and integrated PD-SQuaRe control and analysis module. Regardless of sample size, thickness, or surface type, RUDOLPH S 3000 S allows for simultaneous measurement of various film parameters.