Used RUDOLPH S3000S #9304275 for sale

Manufacturer
RUDOLPH
Model
S3000S
ID: 9304275
Film thickness measurement system, 12" 2011 vintage.
RUDOLPH S3000S Ellipsometer is an optical instrument used to measure the optical properties of thin film materials and surfaces. It utilizes a near-infrared laser beam, which is directed at a sample surface where it interacts with the material in a precise manner. The reflected beam intensity is measured at two different angles and the resulting data is analysed in order to determine the optical properties. This type of analysis can be used to assess the thickness and index of refraction of a material. RUDOLPH S 3000 S model is designed for research uses, such as determining the properties of semiconductor devices and electronic components. It features a highly sensitive interferometer and a high-resolution camera to detect the subtle variations in light intensity. It also offers an automated sample stage and a large, easy-to-read touchscreen display. The system is capable of controlling various parameters associated with experiments, such as sample temperature, polarization, and speed. S3000S uses advanced software to parametrically analyze the data, using the four Poincaré parameters - absorption, retardation, ellipticity, and azimuth. This enables the precise measurement of thickness and refractive indices of sample materials and surfaces, with accuracy levels as high as 0.5nm for thin film thickness and 0.001 for refractive index. Additionally, the system can be used to detect stress-induced birefringence and layer crystalline properties. S 3000 S is compatible with a wide range of sample materials and surfaces, including metals, polymers, dielectrics, semiconductors, thin films, and coatings. This makes it an ideal instrument for research and development in the electronics and optics industries. It is designed for use in laboratories as well as other professional settings, including universities, research centers, and high-throughput reticle production facilities. Overall, RUDOLPH S3000S Ellipsometer is a powerful instrument for thin-film materials and surface analysis. It offers unparalleled accuracy and reliability, and can be operated autonomously for maximum productivity and convenience. With its advanced software and intuitive control panel, RUDOLPH S 3000 S is an ideal tool for research and quality assurance in the electronics and optics fields.
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