Used RUDOLPH S3000S #9389600 for sale

RUDOLPH S3000S
Manufacturer
RUDOLPH
Model
S3000S
ID: 9389600
Film thickness measurement system.
RUDOLPH S3000S industrial ellipsometer is a precise measurement instrument for the characterization of film properties of semiconductor materials. Built according to demanding applications in the semiconductor industry, RUDOLPH S 3000 S has highly integrated software and hardware options to accommodate specific customer requirements. With its one-of-a-kind software suite, Agilis Pro 3 and Agilis Core 7, S3000S provides a range of data collection and analysis modules that can be used for a wide range of research and development applications. S 3000 S provides precise, accurate, and repeatable measurements on a broad range of materials. Its patented dual beam technology allows the ellipsometer to measure multiple layers in the same sample or a single sample surface, and it offers high signal-to-noise ratio for a better analysis. The ellipsometer is easy to use, thanks to its intuitive graphical user interface. It allows users to quickly set up sample parameters, calibration settings, and measurement ranges. It also features a variety of software applications, such as real-time display of the film stack structure, plotting of ellipsometric curves, layer-by-layer analysis, and comparison of curves. RUDOLPH S3000S ellipsometer offers a room-temperature operation option, as well as the ability to measure in a wide range of temperatures, from -10°C to +90°C, enabling faster film characterization. A choice of film characterization parameters is available on RUDOLPH S 3000 S, including polarimetric parameters, like gamma and delta, optical constants (refractive index and extinction coefficient), as well as layer thicknesses and concentrations of multiple components. S3000S ellipsometer is incredibly efficient, with a cycle time of up to 7 seconds. The high speeds of S 3000 S enable faster testing and customized film stack modeling. For cleanliness and accuracy, RUDOLPH S3000S is fitted with a semiconductor grade optics system, designed for multiple layer films and multi-point analysis. Overall, RUDOLPH S 3000 S industrial ellipsometer is an ideal tool for research and development laboratories in the semiconductor industry, providing the perfect blend of accuracy, speed, and value. It offers a wide range of applications, and the highly integrated software is sure to give any user a reliable and repeatable measurement.
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