Used RUDOLPH S3000S #9393060 for sale

RUDOLPH S3000S ellipsometer is a powerful, precise tool for measuring the optical properties of thin materials. The system allows for the determination of thickness, refractive index and extinction coefficient of materials with a thickness range of 1 nm to 10000 nm. RUDOLPH S 3000 S utilises the principle of ellipsometric measurement which allows characterization of the optical constants of the material by measuring the ellipsometric parameters and analyzing the surface film thickness and its chemical compositions. The instrument holds a high accuracy of less than 0.2° polarimetric accuracy, along with a spectral range from 200 nm to 1000 nm. This range is divided into 16 fixed lasers from 250 nm to 800 nm with 0.5 nm increments, along with the additional option of full-spectral coverage from 200 nm to 1000 nm. The set-up of S3000S is simple and easy, with interchangeable polarizers in the sample chamber, optional lenses to increase spot size and an LED light source. The instrument also has an eight-position sample stage with Peltier cooling and heating than can reach temperatures of up to 200°C, with an optional exchangeable lens for measuring thick layers. For data analysis, RUDOLPH Software or other custom software can be used. Some of the properties of S 3000 S make it particularly highly-suited in certain applications. Its ultra-high resolution can be used to study photovoltaic materials, its wide spectral range can be used for dielectric and semiconductor materials and its high accuracy for optical thin films. In conclusion, RUDOLPH S3000S is a versatile tool for measuring optical properties of materials with remarkable precision. Its accuracy, range, sample stage and the ability to analyse the data with custom software make it an extremely valuable instrument for advanced research and development in the field of photovoltaics and optical thin films.