Used RUDOLPH S3000S #9401466 for sale

RUDOLPH S3000S Ellipsometer is a high-precision, high-resolution optical ellipsometer used for critical thin-film characterization measurements. This advanced analytical tool measures the change in optical properties of a thin film as a light beam passes through it from the sample side. The ellipsometer measures the angles of polarization change, which is then used to generate information about the film's thickness, refractive index and optical anisotropy. RUDOLPH S 3000 S Ellipsometer is designed with a rotatable sample stage and four-channel wavelength selection, which combines to provide a powerful tool to measure highly demanding samples. The rotatable sample stage allows for angularly diverse measurements to be taken. Wavelengths can be selected from UV, VIS, NIR (Near infrared), and MIR (Mid infrared) ranges which can then be read simultaneously within S3000S differential analyzer. The dual-viewing port also permits simultaneous measurements of transmission and reflection, or transmittance and polarization-based measurements. S 3000 S is highly compatible with many different controller and isolation systems, allowing for its use in a variety of environments. Its motorized optics allow for easy alignment in both the horizontal and vertical planes in order to optimize sample examination. The instrument also serviceable and user-friendly, allowing for simple maintenance and operation. RUDOLPH S3000S Ellipsometer makes it possible to tackle the thinnest films and most challenging substrates, offering greater characterization capabilities than other ellipsometers. Its quick data acquisition enables researchers to analyze complex samples with speeds ranging from 5 minutes to several hours, depending on the number of parameters being evaluated. RUDOLPH S 3000 S Ellipsometer is an indispensable tool for research, industrial and academic applications, providing highly accurate and reliable results for complex optical substrates and samples.