Used RUDOLPH S3000S #9401470 for sale

RUDOLPH S3000S
Manufacturer
RUDOLPH
Model
S3000S
ID: 9401470
Wafer Size: 12"
Vintage: 2010
Film thickness measurement system, 12" 2010 vintage.
RUDOLPH S3000S is an advanced ellipsometer designed for precise physical characterization of thin films. Ellipsometry is a widely used analytical technique for measuring the optical properties of surfaces, allowing for the accurate determination of film thickness, composition and refractive index. This powerful instrument uses light from adjustable wavelength sources and a sophisticated combination of polarizers and detectors to measure changes in the polarization state of the light reflected off the sample surface. RUDOLPH S 3000 S is a robust, easy-to-use instrument that allows users to optimize their measurement setup, select wavelengths, set parameters, and maintain accuracy of results. Its user-friendly interface helps users to quickly and accurately measure optical performance of samples across broad wavelength ranges. Its high-speed, high-precision polarization manipulation provides superior reliability and repeatability. Additionally, this instrument utilizes a polarized beam configuration which helps to minimize noise and produce high-resolution results. In addition to providing accurate and reliable measurements, S3000S also provides advanced data analysis capabilities, including automatic phase map generation; automated film parameter calculation; automated surface roughness calculation; and optical simulations to determine the compatibility of various materials. This instrument also has an array of features to help users protect their data, including secure encryption for data transmission and storage, password protection, and access control. S 3000 S also includes a range of accessories to improve the user experience, including a camera and automatic focus system, adjustable temperature chamber, and software packages for advanced data analysis. This versatile ellipsometer is suitable for a broad range of materials, including metals, dielectrics, and semiconductors, providing reliable, accurate results in a wide array of applications. With its intuitive interface, advanced features, and robust performance, RUDOLPH S3000S is an excellent choice for those looking for an efficient, reliable ellipsometer for their research or analytical applications.
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