Used RUDOLPH SS1 #9126170 for sale

RUDOLPH SS1 is an automated, high-performance spectroscopic ellipsometer designed for accurate measurement of optical anisotropy. The system is designed to measure the changes in refractive index, extinction coefficient, absorption coefficient, and other optical properties of materials with sub-nanometer accuracy. SS1 features a sophisticated yet easy-to-use software package that allows for the analysis of multiple angles of incidence and polarization and is capable of both dry and wet measurement techniques. The heart of RUDOLPH SS1 is its spectrograph-focus optical module, which allows for the simultaneous measurement of up to four different samples with a single laser pulse. The laser pulse is used to introduce an optical element, such as a quarter-wave plate (QWP), into the sample arm. The QWP is used to introduce a polarization anisotropy into the sample such that the difference in the angle-dependent refractive indices can be measured with high precision. This measurement is then used to determine the optical properties of the sample. SS1 is fully automated, allowing for the autonomous measurement of an array of samples. It features a user-friendly software interface that allows for the easy manipulation of the spectroscopic parameters, such as angle of incidence, wavelength range, and desired resolution. The system is pre-programmed with determinations of various optical constants related to the sample, such as absorbance, reflectance, and birefringence. All data collected by RUDOLPH SS1 is recorded and can be user-defined via the software interface for further analysis. Additionally, SS1 is highly versatile in its performance. Its operational flexibility allows for the measurement of thin-film coatings, electronic materials, and semiconductor-based devices with sub-nanometer resolution. The system is also configured with a variable polarization selector for the simultaneous measurement of samples with differing degrees of polarization anisotropy. All in all, RUDOLPH SS1 is an advanced spectroscopic ellipsometer that is capable of accurately measuring optical anisotropy with sub-nanometer accuracy. Its automated interface and user-friendly features make it a reliable and versatile solution for the analysis of a wide range of samples.