Used SEMILAB GES-5E #9239630 for sale

SEMILAB GES-5E Ellipsometer is a versatile and precise instrument designed for measuring the optical properties of films and interfaces with a wide range of materials. SEMILAB GES5E offers a uniquely tailored combination of parameters to adapt to a wide variety of activities ranging from optical characterization of surfaces to advanced angle measurements. Additionally, GES-5E is equipped with a motorized sample stage with automatic sample positioning capabilities and a highly sensitive software for easy navigation and analysis. GES5E utilizes polarized light reflected from the sample surface to measure the reflectance and polarization state of the waves. The complex-valued quantity, measured simultaneously with two independent angular detectors, is used to infer an accurate representation of the parameters of the material or sample. SEMILAB GES-5E offers a angular range of measurement of up to +/-4.8 degrees, allowing for multiple sample measurements within a single angular range. Furthermore, this device features a high-accuracy monochromator with a grating of 512 grooves/mm, resulting in a spectral resolution of up to 0.003 nm per step. It also incorporates a high speed grating autofocus system with a motorized calibration arm that delivers accurate focus which minimizes dead zones. SEMILAB GES5E is compatible with SEMILAB software, offering intuitive and powerful user interfaces and data analysis capabilities. This user-friendly and comprehensive software provides advanced tools for data manipulation (plotting, mathematical operators, etc.), data reporting, and so on. It also includes specialized algorithms specifically designed for ellipsometer data, providing support for Mueller matrix and prism spectroscopy measurements. In summary, GES-5E Ellipsometer is a reliable, versatile tool for measuring optical properties of surfaces and interfaces with a range of materials. It is equipped with a high-speed autofocus grating system and a sophisticated software for easy navigation and analysis, providing powerful data manipulation capabilities, reporting support, and specialized algorithms specifically designed for ellipsometer data.