Used SEMILAB PS 2000 #9244402 for sale

SEMILAB PS 2000 Ellipsometer is a powerful, multi-functional ellipsometry equipment designed for advanced precision thin film transparent coatings. This system provides simultaneous measurement of the polarizabilities of all three polarized light components of the incident beam, enabling a precise characterization of sample angles and characterizations of the sample that depend on optical properties of its constituent materials. The unit can be used for a wide variety of applications, including ellipsometry of thin films, measurement of optical constants, characterization of diamond-like and nano-crystalline carbon thin films, measurement of surface morphology, and study of sample properties (such as refractive indices and extinction coefficients). The hardware of PS 2000 consists of a compact, easy-to-use single core ellipsometer that is specifically designed for the simultaneous investigation and characterizations of both visible and infrared light. The machine consists of a rotatable polarizer, sample and detector, a monochromator, a polarizing beam splitter, and two measurement arm lengths. The polarizer is driven by a stepper motor controlled through a microcontroller unit. The sample and detector are connected to detectors via a cooled optical fibber, allowing the user to acquire simultaneous spectral data from both the visible and infrared regions. An efficient stationary polarizing beamsplitter composed of two high-power lasers is used to achieve high measurement accuracy. The monochromator, which consists of a collimating lens, a disperser, and a scanning stage, is driven by a stepper motor and controlled through a microcontroller unit. The software associated with SEMILAB PS 2000 includes a full-featured user interface, the PCL Controller, an intuitive and powerful graphical user interface. It also includes a high-precision measurement program, which supports the measurement of either the reflectivity or the angle - of incidence - new to the field of ellipsometry. The PCL Controller automatically controls the sample and measurements with pre-defined ASR and AMR settings, enabling the user to easily create and save scenarios for repeatable experiments. In addition to the standard features, PS 2000 also includes an optional tool calibration component that provides an intuitive method of calibrating the optical asset for use in the measured model. This method allows the user to quickly set up the equipment for precise and repeatable characterizations. Other system components include a low intensity source for measuring the optical constants, a liquid nitrogen cooled detector for rapid data acquisitions, and a manual polarizer calibration. SEMILAB PS 2000 Ellipsometer is a powerful and reliable tool for characterizing many of the advanced thin film transparent coatings found in today's research and development laboratories. Its innovative design allows the user to quickly and accurately characterize materials properties and optical constants with unparalleled precision. With the ability to measure both visible and infrared light polarization simultaneously, this unit is able to provide detailed and comprehensive characterization of materials.