Used SENTECH 400ADV #9036894 for sale

SENTECH 400ADV is an advanced spectroscopic ellipsometer designed to measure the optical properties of surfaces with extraordinary detail and accuracy. The four wavelength system is equipped with a pair of dual wavelength detectors allowing for simultaneous measurements of both p- and s-polarizations across the UV, VIS, and NIR spectrums. This instrument utilizes a rotating analyzer to measure the change in the polarization of light as it reflects off the sample surface. The results are used to calculate the refractive index and extinction coefficient of the sample materials, yielding useful information on surface composition, molecular structure, and layer thickness. The instrument also includes a computer-controlled ultra-high precision motor stage, allowing for fast and precise inspection of large sample areas. It is capable of measuring up to 3 cm2 of a sample's surface with high resolution, no matter the size, shape, or material, at a speed of up to 20 points per second. This means that even the most complex surfaces can be accurately mapped in a timely fashion. It also features an intuitive, user-friendly software that helps the user set up the experiment, store data, analyze results, and generate reports. This software works with the user's computer to collect all the necessary parameters directly from the spectroscopic ellipsometer, ensuring precise measurements that are free from human error. In addition to great accuracy and exceptional speed, 400ADV also features high stability and robustness. It's designed to withstand harsh environmental conditions, and it can sustain temperature fluctuation up to ± 3 °C without compromising its performance. Its modular structure enables users to easily use/replace components if necessary. Overall, SENTECH 400ADV is an ideal choice for anyone looking for precise and reliable measurements of their samples' surface properties. With a diverse array of features, this ellipsometer makes it possible to quickly and accurately obtain data on the optical properties of materials in a wide variety of applications, from semiconductor research to biomedical analysis.