Used SENTECH SE 400 #190266 for sale

SENTECH SE 400 is an ellipsometer developed by SENTECH Instruments GmbH, which is designed for users who require precise ellipsometric information with reliable operation. SENTECH SE400 uses modern technology to measure the refractive index, absorption and film thickness of a variety of materials, including thin film coatings, semiconductors, polymers, wafers, and liquid crystals. SE 400 ellipsometer is a modular system that can measure multiple samples simultaneously and is highly adaptable. It is equipped with a double beam polarization scanner that enables high signal-to-noise ratios and allows for measurements over large angles of incidence. It comes equipped with software that offers user-friendly interface for parameters optimization, in addition to displaying and storing measurements. SE400 has a measuring wavelength range of 375-1050nm and offers a wide range of measuring conditions. Both Brewster angle and normal incidence configurations are available for obtaining reliable and accurate parameters. The adjustable motorized sample holder provides both uniformity and repeatability of measurements. SENTECH SE 400 provides precise measurements with a Z-scan feature. This feature measures the exact film thickness to an accuracy within up to 0.1nm. The OLED color touch screen ensures an intuitive and reliable interface with the device as well as display of measurements. SENTECH SE400 also has a built in database to store measurements for future reference. SE 400 is an excellent choice for both R&D and industrial applications. It provides accurate and reliable measurements even on surfaces with low reflectance and/or low profile layers. Its intuitive user interface and easy operation makes it ideal for quick measurements on production lines or in laboratories. SE400 is also RoHS Compliant and ISO 9001 Certified, providing users with the highest standards of quality control.