Used SENTECH SE 400 #9208990 for sale

SENTECH SE 400 Ellipsometer is an optical thin film characterization tool used to measure the optical properties of thin films and surfaces. The instrument is designed to measure the angle of polarization shift and ellipticity of polarized monochromatic light, reflecting off a sample surface. This shift and ellipticity vary depending on the optical properties of the sample, such as thickness, refractive index and relative dielectric properties of the thin films. SENTECH SE400 Ellipsometer is a tabletop device with a compact footprint. It combines optics, mechanics, electronics, and software to produce versatile and accurate analyses of thin films, such as antireflective and transparent dielectric coatings. The instrument features a high-speed rotating compensator and a two-angle ellipsometer head to provide the flexibility necessary for the characterization of even the most complex samples. SE 400 Ellipsometer delivers very precise optical data, using a sophisticated optical and sample positioning system which produces an automated, accurate, repeatable and reliable measurements. The instrument can measure both the absolute and relative characteristics of the sample, and can be used for a wide range of applications, such as determining film thickness, refractive indices, extinction coefficients, optical constants and anisotropy. The instrument is easy to set up, operate, and maintain. It has a simple graphical user interface on a color LCD that shows operator-selectable parameters and output, such as film thickness, refractive index and optical constants. The outputs can easily be displayed and printed. SE400 Ellipsometer is a reliable, durable and accurate instrument with a comprehensive range of optical parameters that can be accurately and quickly measured. This makes it an ideal choice for thin film characterization applications.