Used SENTECH SE 400ADV #9202977 for sale

SENTECH SE 400ADV is an advanced ellipsometer designed to measure the properties of thin film materials. The equipment is designed for a wide variety of applications including optical coatings, semiconductor materials, and nanoscale layers. It can accurately measure a wide range of optical thicknesses, refractive indices, film stresses, and layer materials. SENTECH SE400ADV offers high accuracy, repeatability, and speed of measurement, with an expanded range from below 0.1 nm to several microns in optical thickness. The system features a clickless rotator, allowing for continuous angular measurement and angle settings down to 0.3 arcsec increments. The polarizing microscope is optimized for high resolution images, allowing for fast characterization of thin films. SE 400ADV unit comes with a powerful Windows software package. The GUI allows for easy manipulation of parameters and data analysis. The user-friendly interface enables quick and efficient set up and advanced data analysis. It also allows for archiving and restoring data, which can be used for comparison of film parameters at different time periods. SE400ADV comes with an automated alignment machine which ensures reliable and accurate measurements. The automated tool eliminates the need for manual adjustment and ensures a consistent performance between multiple measurements. Furthermore, the asset can measure samples with irregular surfaces, such as structured films. SENTECH SE 400ADV features a built-in quadrant detector, allowing for simultaneous analysis of multiple samples. The real-time collection of data enables high throughput, and the graphic display of results allows quick and easy comparison of sample parameter distributions. Additionally, the instrument can be equipped with multiple beam platforms, including left and right circular polarizers, IR fibers, and a laser available in the visible and near-infrared ranges. SENTECH SE400ADV provides an advanced, high-precision, and high-performance platform for thin film characterization. With its user friendly interface and automated alignment, the instrument is a reliable tool for both research and quality assurance applications. Using the model, researchers can quickly and accurately gain insight into thin film properties, ensuring accuracy and repeatability of measurements.