Used SENTECH SE 400ADV #9258061 for sale

SENTECH SE 400ADV is a high precision spectroscopic ellipsometer designed for the analysis of thin films and surfaces. It is the ideal tool for research and development in the semiconductor, optoelectronics, automotive, and surface sciences industries. SENTECH SE400ADV is designed for accuracy, with excellent reproducibility and an ambient repeatability of 0.15 degrees in Ellipsometric Ψ / Δ. A high performance, ultra-stable laser illumination source and detector construction ensure consistency and integrity in measurements. SE 400ADV offers auto-calibration functions and automatic process correction, as well as flexibility from 22 wavelength settings from 190nm to 1150nm to allow measurements of optical constants and non-Lambert parameters. Its high speed speckle ellipsometer allows for fast time dependent measurements and its patented innovative solutions, such as the Automatic Sample Positioner, make this a powerful research tool. SE400ADV comes standard with a 6-inch sample chuck, providing a 0.2µm step accuracy at the sample level, and a carbon dioxide laser microscopy attachment, allowing the user to study microstructures with topographic, reflectivity and roughness measurements with true nanometric resolution. An optional polarization modulator permits the determination of birefringence and optical rotation of films or materials, extending the range of applications and possibilities. SENTECH SE 400ADV has an intuitive and user-friendly operation with either Windows or Linux software, maximizing the user experience with a variety of practical and useful features. They include a full-fledged point-and-click graphical user interface, a selection of curve fitting functions, and the ability to export measurement data in the most common file formats. SENTECH SE400ADV is the perfect solution for applications requiring the most accurate results, like measurement of optical constants, non-Lambert parameters, deposition layers thickness, layer refractive index, polarization measurements, and real-time measurements. Whether for research and development or industrial process monitoring, SE 400ADV goes beyond standard ellipsometer methods, leading the way in film analysis.