Used SENTECH SE 400ADV #9286513 for sale

SENTECH SE 400ADV Ellipsometer is a versatile and precise optical measurement equipment designed to analyze thin film surfaces from the visible region into the near-infrared (NIR). The system is designed to detect extremely thin coatings as well as transparent materials with application in semiconductor device development and other optoelectrical, optical, and optical coatings measurements. SENTECH SE400ADV measures the polarization state of reflected light to accurately determine the optical properties of films on surfaces. The unit offers automatic and manual alignment with high precision and repeatability. It also features a large data acquisition memory and a high speed data acquisition rate, allowing extended measurements and high-throughput data acquisition. SE 400ADV Ellipsometer is capable of providing quantitative and qualitative information about film layers on the substrate. Furthermore, the machine offers a wide range of analysis capabilities, including composition, deposition rates, topography, conformality, and thickness. The use of a Helmholtz coil can be used to reduce the background noise and provide higher precision results. SE400ADV has a fully automated software interface, allowing for easy and quick setup and data collection. The user can define the measurement parameters and the data collection parameters. The intuitive graphical interface allows for rapid experiment design and data handling. Furthermore, the software automatically generates calculations on the collected data allowing a quick and easy analysis. SENTECH SE 400ADV also offers an advanced analysis tool, allowing users to go beyond the quantitative results. The asset allows for detailed visualization of the measured film layers, including orbital and energy regualization diagrams. Furthermore, the analysis model can generate advanced surface properties including composition, interface roughness, optical constants, and much more. SENTECH SE400ADV Ellipsometer is an easy to use, versatile, and precise optical measurement equipment designed to analyze thin film surfaces. It is ideal for semiconductor device development and other optoelectrical, optical, and optical coatings measurements due to its high speed data acquisition rate and wide range of analysis capabilities. With its automated software interface and advanced analysis system, SE 400ADV allows users to quickly and accurately gather all the materials properties needed for a successful analysis.