Used SENTECH SE 400ADV #9316098 for sale

SENTECH SE 400ADV is an ellipsometer which enables the non-destructive, precise, and accurate measurement of the thin-film optical properties on a variety of substrates. This ellipsometer is a versatile instrument which provides a collection of powerful features and can measure both reflection and transmission layer thickness of dielectric films on metallic substrates in an extremely short time. SENTECH SE400ADV is designed with a circular polarization light source and an objective that forms a non-imaging, coaxial, and directed illumination system. This allows for a non-destructive analysis, allowing the measured sample to stay intact. The spot size of SE 400ADV is adjustable, with a sample beam measure of 2 millimeter. The objective lens collects the reflected and refracted light and focuses the beam onto the precision spectrophotometer. SE400ADV analysis contains three different measurement configurations, each with their own capabilities. Determination of the optical constants for a sample, such as index of refraction and absorption, can be achieved by collecting parameterized data. The ellipsometer can also be used to determine the thickness of thin-film layers with the dual wavelength configuration. These three configurations are recorded in a single automatic scan and can quantity the results through SENTECH software. SENTECH SE 400ADV setup also comes with an inbuilt roughness indicator. This allows for an analysis of the surface roughness of a substrate. The instrument is also equipped with an advanced automatic wavelength selection. This feature enables a faster analysis by using the correct wavelengths for a certain substrate. The instrument itself has a very low orbital drift which is a result of using a low-noise light source and active thermoelectric cooling. The built-in computer interface comes with a 7-inch display that is designed to be easy to navigate. In addition, the interface allows for quick and easy software upgrades and updates. The instrument also comes with a number of pre-defined application programs that allow for fast and accurate data collection and analysis. SENTECH SE400ADV is an accurate and powerful tool for the characterisation of thin films. Its numerous features allow for quicker and easy measurements of thin-film optical properties. The instrument includes pre-defined application programs and a built-in computer interface, making it a great choice for professionals who need to measure thin-film optical properties in a timely and precise manner.