Used SENTECH SE 400ADV #9359635 for sale

SENTECH SE 400ADV is an advanced, high-precision scanning ellipsometer, designed to measure the thickness and optical constants of thin films. It provides excellent accuracy and repeatability, allowing users to track surface quality and process variation over time. The instrument features a 2-axis rotational mounting platform to allow for a wide range of samples to be scanned, while its large active area provides measurements up to 20mm in diameter. SENTECH SE400ADV utilizes a monochromator controlled light source, paired with a high-performance spectrometer. This combination is used to measure the changes in light polarization that occur when light is reflected from a specimen. Using a variety of measured values and measurements, the instrument can determine sample thickness, composition, and layers present on the specimen. The system also includes integrated sample-specific software that provides easy-to-use graphic user interfaces to ensure efficient data collection and analysis. SE 400ADV provides a wide range of applicable materials, such as semiconductors, thin film layers, polymers, and many other materials. It is compatible with both transparent and opaque sample materials, allowing users to analyze a variety of film structures and layer thicknesses. Its exact optical path length alignment enables accurate analysis of small-scale samples with excellent critical dimension and thickness measurements. The system also features a data-driven FilmSmart™ technology which provides automated optimization of the measurement hardware for each sample to ensure maximum accuracy. Additionally, it has a quick and easy setup for multiple samples, making it ideal for use in production facilities. Overall, SE400ADV is a reliable, precise scanning ellipsometer that provides a range of features and accuracy for accurate and detailed measurements of thin film layers, materials, and optical constants.