Used SENTECH SE 800PV #293651593 for sale

SENTECH SE 800PV is an ellipsometer specifically designed for measuring thin films. Ellipsometers measure the optical activity of surfaces - either reflective or transmitBted - in order to obtain information on their thickness, uniformity and refractive index. SE 800PV is a high accuracy device, providing accurate profiles of material thickness, refractive index and optical uniformity. SENTECH SE 800PV utilizes Mueller matrix Ellipsometry to measure the optical activity of surfaces. Its measurements are highly accurate and provide the user with the data needed to analyze and evaluate thin films. The device is equipped with a two-axis compensator allowing high resolution imaging of the sample. The Mueller matrix Ellipsometry method used in SE 800PV utilizes a high intensity polarized light source, which allows for ultra-precise measurements. SENTECH SE 800PV is designed to be used in environments with harsh industrial conditions such as high temperatures, vibration and shock. It is highly compact, making it well-suited for use in laboratories, classrooms and manufacturing settings. The device is also compatible with a range of sample sizes, from macro to micro levels. This makes it ideal for a wide range of tests and applications. The software that accompanies SE 800PV is easy-to-use and provides the user with analytical tools for obtaining detailed profiles of each sample. Furthermore, the software allows the user to store and manage all test data in a single database. The software also supports printing and data export, enabling users to quickly and easily share the results of their tests with colleagues or other facilities. Overall, SENTECH SE 800PV is a reliable and highly accurate device, ideal for measuring thin films. Its Mueller matrix Ellipsometry approach, robust design and easy-to-use software make it useful in a variety of industrial settings, ensuring accurate and detailed analysis of samples.