Used SENTECH Senduro 300 #293666993 for sale

SENTECH Senduro 300 is an advanced ellipsometer designed for material characterization applications. It can be used to measure material properties such as thickness, refractive index, or layer structure. The equipment utilizes a rotating polarization modulator to measure the changes in the polarization state of a light beam as it passes through the sample. It then uses a combination of the reflected and transmitted light to accurately determine the physical properties of the sample. Senduro 300 is equipped with powerful software that is capable of making real-time measurements with high repeatability and accuracy. The intuitive user interface provides an efficient way to setup and control the system. It has the ability to measure films from 0.25 microns up to 500 microns and can measure a variety of sample substrates including wafers, glass, and even irregular surfaces. The instrument can also be used to measure the strain in a sample by utilizing a special measuring head. SENTECH Senduro 300 offers a number of features that make it ideal for research and development applications. It has a dynamic to stationary sample temperature range of 0 to 100 degrees Celsius. This allows the user to measure temperature-dependent properties of the sample. The unit also has the ability to measure a variety of optical constants such as the refractive index and extinction coefficient. Additionally, the machine can measure anisotropy, birefringence, and coherence lengths. In addition to its powerful software, Senduro 300 also includes hardware components designed to improve the accuracy and repeatability of the measurements. The tool includes an automated stage for precise sample positioning, as well as an imaging detector that is sensitive to the polarization of the light beam. This helps to eliminate the effects of external sources of light and improve the accuracy of the measurements. SENTECH Senduro 300 is an advanced ellipsometer that can provide accurate and repeatable measurements of material properties. Its intuitive software is simple to use and provides a variety of measurements such as thickness, refractive index, and layer structure. It is also equipped with a variety of hardware components designed to improve the accuracy and repeatability of the measurements. Senduro 300 is ideal for research and development applications such as film characterization.