Used SENTECH Senduro #293651563 for sale

SENTECH Senduro is an advanced ellipsometer used to measure the thin film thickness, optical constants, and surface roughness of a variety of samples. The ellipsometer can measure samples with a wide range of optical properties, such as refractive index (n), extinction coefficient (k), film thickness (t), surface roughness (r), and other optical characteristics. Senduro utilizes a laser source which is tailored to specific wavelength and angle combinations. The angle is adjustable from 6 to 78 degrees, allowing for a wide range of sample configurations to be evaluated. Additionally, the integrated rotary stage allows for precise angular alignment and a large angular range for sample measurement. SENTECH Senduro utilizes a sophisticated optical sensing system to analyze the orientation of light reflected from the sample. The device can detect changes in polarization of the light according to the thin film changes. This allows for the measurement of a variety of parameters such as thin film thickness, refractive indices, extinction coefficients and surface roughness. Senduro is designed to be low maintenance with no need for additional filters or detector elements. It is highly accurate, with a resolution down to 0.005 in thin film thickness and down to +- 0.001 in refractive indices and extinction coefficients. The device utilizes intuitive software, allowing users to quickly and easily analyze their data. It can store up to 2000 measurements and has a high data transfer rate, allowing users to quickly analyze and save large datasets. SENTECH Senduro is a powerful, accurate and easy-to-use ellipsometer, designed to help users quickly measure thin film properties and optical characteristics. The precise angular alignment and a wide range of wavelength and angle combinations allows for a precise sample evaluation and highly accurate results.