Used SOPRA GES-5E #293616987 for sale

SOPRA GES-5E is an ellipsometer developed and manufactured by SOPRA SA, which is a leading supplier of optical film characterization systems. GES-5E provides precise angular analysis of light reflected from a sample surface, and is designed for quick and reliable measurements. It enables the precise characterization of optical properties of thin film. SOPRA GES-5E features a high resolution microscope and a polarimeter, which allows the precise optical characterization of samples down to 5 nm thickness. The device is equipped with a monochromatic light source, which ensures precise and precise measurements of the light reflected from the film surface. It can be used to measure the refractive index, absorbance, reflectivity, transmission and other optical parameters of a sample. It is equipped with a Modulated Ellipsometry option which provides additional information about the film's optical constants. GES-5E also features an adjustable Polarisation Analyzer, which can be used to measure the reflectivity of sample polarized plane wave light. This feature allows the characterization of optical properties of samples with various polarisations. SOPRA GES-5E can be connected to an external computer, allowing the user to import and export data, as well as monitor measurements in real-time. It is also compatible with a variety of communication protocols, making it possible to connect to external control systems, as well as to control the system remotely. The device is also equipped with an intuitive user interface and it is easy to operate. Its compact design makes it an ideal measurement solution for laboratories with limited space. In addition, GES-5E comes with comprehensive software for data analysis, enabling the user to quickly and effectively interpret the measurement results. Thanks to its portability, SOPRA GES-5E can be quickly moved from one measurement point to another and is suitable for use both in the laboratory and in the field. It is also suitable for use in a wide range of industrial applications, including the characterization of optical materials, semiconductor coatings and photoresists.