Used SOPRA GES-5E #293823339 for sale

SOPRA GES-5E is an ellipsometer designed for the analysis and characterization of thin films and surfaces. The instrument is based on the concept of optical interference and ellipsometry, which allows for the study of the film thickness, refractive index, extinction coefficient, deposition rate, surface roughness, and Ferroelectric properties of materials. GES-5E comes with an integrated vertical automated sample stage, allowing for the rapid and accurate determination of film characteristics over a wide range of samples. The ellipsometer is equipped with a stabilized 632.8 nm wavelength laser and a state-of-the-art photodiode array detector that can measure angles with an accuracy of 0.1°. Additionally, SOPRA GES-5E features a custom designed user interface and WinLab + software, offering the user the ability to control instrument parameters and capture data in real-time. GES-5E ellipsometer offers excellent system performance and high accuracy measurements. The instrument is able to measure different types of surfaces, ranging from flat substrates to microstructured devices, with a resolution down to 0.1 nm. The data can also be exported for further analysis or for integration into other software systems for automated process monitoring and control. The user-friendly software environment, intuitive GUI, fast and accurate modeling capabilities, and comprehensive data export functions make SOPRA GES-5E a powerful and versatile tool for in-depth surface characterization. The instrument can be used in a wide range of research applications, such as thin film deposition, semiconductor processing, optical coatings, and lithography. GES-5E allows researchers to rapidly and accurately analyze thin films, surfaces, and other materials. Its intuitive user interface, automated sample stage, and comprehensive data export features enable researchers to quickly obtain the information they need for their research, as well as enable process monitoring and control.