Used SOPRA GES-5E #9245090 for sale

SOPRA GES-5E
Manufacturer
SOPRA
Model
GES-5E
ID: 9245090
Wafer Size: 8"
Ellipsometer, 8".
SOPRA GES-5E is an ellipsometer, a type of optical instrument which is used to measure the optical properties of a thin film surface or sample. It uses an electromagnetic beam to measure the changes in light's polarization after it is reflected off of the sample's surface. These changes can be quantified in terms of an optical property known as the polarisability. The ellipsometer is designed to accurately measure this property for any particular sample. GES-5E has a textured annular sample mount, which serves to keep the sample flat and level so that accurate measurements can be taken. The textured mount aids in reflections to ensure that accurate results are obtained. It also features an XY stage, which can be used to precisely position the sample itself to the optimum position for testing. At the centre of SOPRA GES-5E is a semiconductor laser diode source, which emits a collimated laser beam that passes through the sample and through the sample stage. This is done in order to analyse the sample's optical properties, such as the changes made to the polarization as a result of the reflections off the sample's surface. The output of the laser beam is then analysed by the spectrograph for the sample, and the resulting spectrograph data is used to calculate the polarisability of the sample. GES-5E then uses this data to display the results graphically to the user. It also features an optional automated sample handling system, which can be used to save time and effort when taking multiple measurements. SOPRA GES-5E is a highly accurate and reliable ellipsometer which is designed for use in industrial applications, such as in laboratories and in the semiconductor industry. Its design is such that it can be used for a wide range of different measurements, including the determination of thickness, refractive index, and extinction coefficient. This makes it an ideal choice for those looking to measure the optical properties of their samples in detail.
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