Used SOPRA GES-5E #9299487 for sale

SOPRA GES-5E is an ellipsometer, a device that measures the change in polarization of light after it has interacted with a sample. It is designed to measure the optical properties of thin films, with an accuracy of 5 angstroms in thickness and 0.01 percent in refractive index, and can be used for a variety of applications in materials science and testing, such as thin film deposition, film growth, defect analysis, contamination monitoring, and film stress measurement. GES-5E features a circularly polarizable laser source and a detector that is sensitive to both polarization and wavelength, allowing measurements to be quickly and accurately obtained. The device is mounted on a nano-positioning system that allows for precise scan movements in the x, y, and z directions, and the system can be computer controlled for rapid data acquisition. SOPRA GES-5E utilizes both spectral-domain and spatial-domain techniques to collect data from the sample. Spectral-domain ellipsometry is used to measure the sample's spectral characteristics, such as its optical constants and its thin film optical parameters, while spatial-domain ellipsometry obtains information on its morphology and composition. By deploying both techniques, GES-5E provides detailed characterizations of the sample's optical properties. SOPRA GES-5E also features advanced software for manipulating the collected data and performing data analysis. The software provides several advanced tools, such as a powerful importing feature that allows for the processing of any type of third-party data, the ability to simulate surface models, interactive graphing for plotting data, and the generation of library spectral scans for comparison and modeling. GES-5E is incredibly versatile and can be used in a variety of environments, such as a laboratory, production line, research facility, or educational setting. Its high accuracy, versatility, and portability make it ideal for thin film characterizations.