Used SOPRA GES-5E #9401838 for sale

SOPRA GES-5E is an ellipsometer an instrument used to analyze thin films and layers by measuring and analyzing the change in polarization of a light beam. This particular model is considered versatile, intuitive, and reliable and is used to measure sample thicknesses between 20 nanometers to 2000 nanometers and examine any given films with a high degree of accuracy. The device operates on the principles of Ellipsometry where changes in polarization of a light beam caused by varying layers of material and their respective optical properties are interpreted to provide accurate data. A known angle of incidence is targeted, then the polarization of the beam is measured using a dual detector arrangement. The detectors record the intensity of the scattered radiation which is then processed by a powerful ARM processor, along with sophisticated algorithms and software, resulting in the formation of a graph. This graph displays the measured value of the change in polarization for the given material and its thickness. GES-5E is a user friendly, all-in-one design containing a built in data analysis computer and touch panel user interface, consisting of an easy to use graphic interface and set of application software. In addition to display, data analysis and reporting, this interface also allows access to modify any settings and parameters. The unit includes a mechanical support arm that enables the user to position the beam spot to any desired area on the sample stage and to maintain the same angle of incidence to within one degree. This ensures the instrument's high accuracy in measuring the optical constants of the sample sample surface. SOPRA GES-5E is equipped with quartz halogen lamp for high intensity incident wavelength and a dual detector spectral range from 350nm to 1000nm. It also offers a wide range of measurement functions, including raw data display, dynamic mapping, and full range parameter measurements. Its intuitive operation makes it an ideal choice for researchers, engineers, and users in various fields such as material research, semiconductors, and optics.