Used SOPRA GESP-5 #293793402 for sale

SOPRA GESP-5 is an ellipsometer, designed for measuring thin film material thickness and for optical characterization of surfaces. It is a high precision instrument manufactured by SOPRA Mesure in France. It uses the measurement of the variation of polarization state of light reflected or transmitted from a surface to determine the dielectric parameters of the material, such as thickness and refractive index. It is typically used for monitoring thin film growth or etching processes over a wide range of deposition rates. GESP-5 features a single chip CMOS detector and a state-of-the-art optical system, providing sub-Angstrom and nanometer accuracy. It contains digital lock-in amplifiers and advanced spiral scanning technology that allows for the measurement of ultra thin layers with high accuracy. The system can provide high accuracy data for measurement of a single layer or stacks of layers up to 20 layers. The system is equipped with a 4" adjustable sample holder and is designed for compatibility with most standard wafer carriers. It can be configured with UHV transport systems for elctro-optical analysis of surfaces under various pressures and temperatures. SOPRA GESP-5 is integrated with an automated software suite to provide accurate and repeatable ellipsometric measurements which allows the user to monitor horizontal and vertical polarization ratio, absolute film thickness, refractive indices, and dielectric functions. It also includes several data analysis functions such as phase shifting, azimuthal averaging, and mixed measurement mode (reflectance-transmittance). The instrument is designed to be flexible and easy to use. It can be used in a variety of applications such as solar cells, optical coatings, semiconductors, organic materials, and other thin film studies. Its durable construction ensures reliable operation with low maintenance needs.