Used SOPRA GESP-5 #9245058 for sale

SOPRA GESP-5 is an ellipsometer designed for characterizing the Optical Properties of thin films used in electronic circuits, optical components, optical coatings, and other materials. It uses advanced technologies to measure the reflectivity and polarization of light reflected from a sample or substrate surface while keeping the sample at a constant temperature and with low mechanical strain. The device's advanced optics and two-dimensional optical scanner allows for a high level of precision and accuracy in determing the shape and thickness of the sample. GESP-5 is designed with a user-friendly menu of options for easy data retrieval. An integrated software package collects, stores, and analyzes both static and dynamic data in the form of graphs and charts, allowing for an analysis of a sample's optical properties at different time points. To ensure efficient and accurate measurements, SOPRA GESP-5 uses a special protech technique where multiple sets of angles are acquired and analyzed at a maximum speed of height times faster than a traditional rotating ellipsometer. This technique is ideal for generating precise chemical and structural information on a nanometer scale, allowing for quick and accurate characterization of thin films. The device also features environmental control sensors and integrated sample temperature control. This helps to eliminate interferences caused by external factors such as temperature and humidity, allowing for reproducible results throughout different measurement processes. To ensure accurate measurements, GESP-5 is also equipped with a high-precision optical design. The optics use an advanced light sources, mirrors, and lenses to generate and detect light that is reflected from the sample's surface. The optics also help to minimize noise and focus the light in the correct direction for quick, accurate, and repeatable results. Overall, SOPRA GESP-5 is an extremely precise and versatile ellipsometer used for studying thin films and researching their optical properties. Its advanced optics, integrated software package, environmental sensors, and precision optical design allow for accurate measurements at a nanometer scale, making it an invaluable tool in materials research.