Used SOPRA GESP-5 #9384906 for sale

SOPRA GESP-5 is an automated, opto-mechanical scanning ellipsometer that is designed for precision and accuracy in the measurement of thin-film optical properties. The instrument is equipped with a tunable laser, focussing and scanning optics, and an optical detector. It is able to measure the optical properties of films from a few nanometers to several micrometers in thickness over a wide range of wavelengths. GESP-5 system is designed to allow for easy sample exchange and robotic handling. It includes a sample holder with positioning rotation for easy loading and unloading of samples. A motorized z-axis is also included for optimal optical alignment of the sample surface. A variety of sample stages are available for different sample types; a heated sample table is also available for temperature controlled measurements. SOPRA GESP-5 has a variety of measurement modes; it can measure both P- and S-polarized incident light. It also includes an automated motorized polarization rotator and optical system, to allow for precise polarization control during the measurement. The device is capable of measuring the optical parameters reflectance, transmittance, and absorbance as a function of wavelength and angle of incidence. GESP-5 uses a patented SOPRA auto-scan software package that allows for automatic measurements of film parameters over a wide range of incident angles. The software includes adjustable parameters for sample position, background scan, etc. and can capture images from the sample surface. The device is designed to be used in both research and production environments. It is particularly well suited for in situ measurements due to its stable and accurate optical design, allowing it to perform measurements in both wet and dry conditions. The instrument also meets current semiconductor industry requirements, enabling static and dynamic scanning measurements of thin-film optical properties. Overall, SOPRA GESP-5 platform provides accurate, reliable, and repeatable measurements of thin-film optical properties. With its robust design, wide range of features and versatile software, it is an excellent tool for research and production in thin-film optical material characterization.