Used SOPRA GXR #9172335 for sale

SOPRA GXR is a compact and versatile single-sample ellipsometer designed for accurate thin-film analysis in the research and development laboratory. It measures reflectance parameters of a sample's surface layer, helping to determine the refractive index, layer thickness and optical constants. GXR consists of a broadband light source, a variable polarizer, and a rotating analyzer, all mounted on an adjustable arm. The beam of light from the source is polarized and reflected off of the sample. The polarizer is altered and the resulting elliptically polarized light is then detected and measured by the rotating analyzer, which measures the phase shift and amplitude of light after reflection from the sample. The results can then be analyzed to determine the sample properties. SOPRA GXR has sample holders that can accommodate up to 5mm diameter samples, making it well suited for examining flat substrates like thin film optical components and semiconductor wafers. It is also capable of measuring incident angles up to 75° and polarization up to 30°, allowing the user to compensate for any substrate-induced depolarization. GXR is equipped with a piezo-driven elevation stage that enables focus correction as well as sample grooving for layer thickness studies. SOPRA GXR uses laser wavelength and polarizer settings that make it compatible with a variety of materials, including dielectrics, polymers and nanomaterials. Additionally, its advanced features enable users to perform advanced measurements, such as the analysis of multiple topography structures and multi-angle measurements. The versatile software includes multiple data processing modes, and the instrument can be integrated into automated production lines. Overall, GXR is an excellent choice for characterization of thin-film properties due to its ease of use, precision, and versatility. The compact design is ideal for laboratories where space is limited, and its advanced features offer flexibility for advanced application measurements.