Used SOPRA IRSE-200-SE #9124701 for sale

Manufacturer
SOPRA
Model
IRSE-200-SE
ID: 9124701
Wafer Size: 8"
Vintage: 2006
Ellipsometer, 8" Operating system: Windows XP SP2 Winse wafer s/w: 2.8.4.6 K7 Holder 1: Up to 300mm open FOUP K7 Holder 2: Up to 300mm open FOUP 2006 vintage.
SOPRA IRSE-200-SE ellipsometer is a powerful optical metrology tool used to measure thin film properties such as thickness and composition. It works by determining the polarization properties of light as it passes through or is reflected off the surface of a sample. IRSE-200-SE uses ellipsometry to measure thin film properties. Ellipsometry is an optical technique that is highly sensitive to changes in refractive index, thickness, and surface roughness of the sample being measured. It uses two components: a light source and a polarimeter. The light source illuminates the sample and the polarimeter measures the changes in the polarization of the reflected light. SOPRA IRSE-200-SE uses a 785 nm laser diode for its light source and a double homodyne ellipsometer as its polarimeter. The laser diode delivers light with a relatively narrow spectral bandwidth, providing an improved signal-to-noise ratio for measurements. The double homodyne ellipsometer utilizes two polarizers to measure the polarization of the reflected light. This allows for more accurate measurements than a single polarizer system. IRSE-200-SE is capable of measuring a wide range of film thicknesses, from a few nanometers up to a few hundred nanometers. As the laser diode is perfectly collimated, measurements on non-flat surfaces, such as metals and hard plastics, can be taken with high precision. Measurements can also be taken at higher wavelengths than visible light, allowing for the analysis of dielectric stacks and organic materials. SOPRA IRSE-200-SE allows for both real-time measurements and analysis, as well as post-experiment data analysis. It has a customizable user interface that can be tailored to a broad range of measurements, making it suitable for a wide variety of sample types. The system can be controlled via USB, Ethernet, or Wi-Fi, allowing for remote control from any location. Overall, IRSE-200-SE ellipsometer is an ideal tool for thin film measurement and analysis. Its precision and wide range of applications make it a valuable tool for any laboratory or production facility. With its ease of use, customizable user interface, and remote control capabilities, SOPRA IRSE-200-SE is designed to help researchers and scientists get the most out of their measurements.
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