Used TECHNICAL INSTRUMENT COMPANY KMS 300 with K2IND/Nikon #9126174 for sale

TECHNICAL INSTRUMENT COMPANY KMS 300 with K2IND/Nikon
ID: 9126174
Wafer inspection system.
TECHNICAL INSTRUMENT company KMS 300 with K2IND/Nikon is an ellipsometer that is used for the analysis of surfaces and thin films. It measures the reflection and refraction of light at an interface to determine the angle of refraction, thickness, and optical constants of the material being studied. The KMS 300 is an integrated, automated instrument that offers a full suite of analysis capabilities and features, including the measurement of in-situ films with the K2IND software. The KMS 300 utilizes Nikon's proprietary K2IND technology, which combines the sophisticated optical technology of a microscope with a sophisticated data acquisition equipment to provide users with highly accurate and detailed analyses. The KMS 300 is designed for use in research, development, and production. The KMS 300 features an autofocus lens and an automated calibration system that enables users to set up their experiment quickly and efficiently. The unit includes a scanhead that can scan over a variety of sample sizes and materials. The scanhead also allows for multiple wavebands, from UV to IR, to be collected at the same time. The machine also offers manual sample flatness correction and automated film thickness maps for greater accuracy. The KMS 300 utilizes a sample illumination source that is coupled with an imaging tool to capture the reflected light from the sample surface. The captured light is then processed using high-speed digital signal processor (DSP) to determine the angle of refraction and the optical properties of the sample material. The asset utilizes a highly sensitive detector to collect data over a wide range of sample thicknesses and can measure both transmissive and reflective thin films up to 50 nm in thickness. The KMS 300 is capable of performing measurements under a wide range of ambient temperatures and humidity settings, up to 85°C and 95% relative humidity, making it ideal for research and development applications. The model is also designed to be user friendly and includes a color graphical user interface and self-guide tutorials for minimal user guidance to enhance the user experience. The KMS 300 is an advanced research-grade instrument that is ideal for researchers and engineers who require highly accurate and reliable analysis of thin films. It is robust, accurate, and capable of providing reliable results without the need for extensive calibration and maintenance, making it the ideal choice for thin film analysis.
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