Used TECHNICAL INSTRUMENT COMPANY KMS 300 #9126173 for sale

TECHNICAL INSTRUMENT COMPANY KMS 300
ID: 9126173
Wafer inspection system computer / controllers.
TECHNICAL INSTRUMENT company KMS 300 is an ellipsometer used to measure the thickness, refractive index, absorbance, extinction coefficient, and optical constants of thin films. It operates by illuminating a sample with polarized light and measuring changes in the light's polarization angle. These changes in angle are then used to calculate film properties. KMS 300 incorporates dual optical heads, a rotating analyzer, a rotating polarizer, and a high-sensitivity detector for maximum accuracy. TECHNICAL INSTRUMENT company KMS 300 is a versatile device designed to measure a variety of sample types including glass, quartz, sapphire, polymers, monocrystalline and more. It measures the film thickness of transparent, semi-transparent, and reflecting layers, as well as the optical constants of semi-transparent layers to a thickness greater than 4nm. KMS 300 is suitable for a range of applications such as measuring the thickness of antireflection and mirrors for optical, display, and solar energy industries. The instrument is designed to be user-friendly with an intuitive user interface. The software control equipment offers data transfer, graphical display, library functions, trends, and analysis. It also allows the user to enter any measured wavelength in nanometers, and performs a series of tests to determine the sample properties and calculate the film parameters. TECHNICAL INSTRUMENT company KMS 300 provides a number of capabilities and features used to measure the optical properties of thin films. The system comes with a sampling head and sample holder that allow for easy placement of the sample. The unit also comes with a mercury arc light source which produces the near monochromatic light necessary for accurate measurements. The machine also has software to control the measurement process and to store and analyze the data. Furthermore, the tool is built on a solid aluminum base that prevents vibration and maintains static temperature across the testing area. KMS 300 is a highly accurate instrument designed to measure the optical constants, thickness, reflectance, and absorbance of thin films. Its dual optical head design, rotating analyzer, and rotating polarizer provide the highest measurement accuracy. The software control asset and mercury arc light source ensure accurate measurements and data analysis. This advanced, rugged instrument is ideal for the optical, display, and solar energy industries, and is suitable for constant use in laboratory environments.
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