Used TECHNICAL INSTRUMENT COMPANY KMS 310 #9211467 for sale
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ID: 9211467
Vintage: 1997
RT Measurement microscope
Nikon trinocular head
With CFWN 10x/20 eyepieces
AMSCOPE MT300 Video camera
With 30.5 mm/c-mount
(4) Objectives:
CF Plan 10X/0.30 ∞/0 EPI WD 16.5
CF Plan 50X/0.80 ∞/0 EPI WD 0.54
CF Plan 100X/0.95 ∞/0 EPI WD 0.3
CF Plan apo 150X/0.95 ∞/0 EPI WD 02
Motorized X-Y stage
Motorized Z-axis focusing tower
With HEIDENHAIN linear encoders
HEIDENHAIN ND 780 3-Axis digital position display unit
(2) Joystick controllers
CHUI TECHNICAL CORPORATION SLS-150 Fiberoptic illuminator light source
TMC optical breadboard (30" x 60") with table
CHUI Light source powers up
Illuminates from the bottom
HEIDENHAIN Display powers up
Registers the position of the X-Y stage & Z-focus
Joystick moves the X-Y stage around
Other moves the microscope head up and down for focusing
1997 vintage.
TECHNICAL INSTRUMENT company KMS 310 Ellipsometer is a highly sophisticated optical instrument used for film measurement and characterization. It measures the optical properties of optical thin films with extreme precision and accuracy. KMS 310 Ellipsometer measures the phase shift induced in light by a substrate, film or system. It uses a broadband white light source to measure the characteristics of thin films or the properties of surface substrates. The three main components of TECHNICAL INSTRUMENT company KMS 310 are the optical chamber, the optical bench, and the software. The optical chamber is designed to collect the incident white light and redirect it onto the sample at an angle of 45 degrees. The sample is placed in the optical chamber and the optical bench moves in three dimensions to collect the emergent light. The optical bench is equipped with a high-precision quartz crystal interference filter as a wavelength selector, a linear scan mirror, and a high-precision lens. The lens is capable of focusing the light onto the sample surface with a minimum of aberrations. The software of KMS 310 allows for the analysis of the collected light readings. This can be done by inputting the recorded readings into the analysis software and executing an analysis of the collected data. The software performs several calculations to analyze the results, including calculating the relative in-plane angular dependency of the reflected light, the extinction ratio, and the Mueller matrix elements. The analysis results are then used to determine the physical and chemical properties of the thin film or substrate. TECHNICAL INSTRUMENT company KMS 310 is an excellent tool for measuring and characterizing film properties, and is a highly precise and accurate instrument for measuring thin films. Its three-dimensional optical bench is capable of quickly and accurately capturing the incident and emergent light of a sample. Additionally, its software enables the accurate analysis of the recorded data. As a result, KMS 310 is an invaluable measurement and characterization tool that can save time and improve product quality.
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