Used TECHNICAL INSTRUMENT COMPANY KMS 310R #9125976 for sale

TECHNICAL INSTRUMENT company KMS 310R Ellipsometer is a high-precision instrument designed to measure very thin films and layers, as thin as nanometers thick. It is widely used in materials science and engineering for research and process control in semiconductor device, photovoltaic, liquid crystal display (LCD), organic electronics, and other thin film technologies. KMS 310R Ellipsometer is based on a basic ellipsometry principle which networks polarization-resolved reflection of light from a thin surface layer or film. For TECHNICAL INSTRUMENT company KMS 310R Ellipsometer, the incident light with a selected wavelength is p-polarized and the reflected light is analyzed in several polarizations. Polarization-resolved measurements from the polarized incident light allows for determination of the refractive index (RI) and thickness of the thin layer or film. KMS 310R Ellipsometer includes a closed loop motorized system that allows for a fixed incidence angle and a motorized polarizer and detector system which can measure a range of incident, reflected and polarizations. The system has a high sensitivity, 5 nm resolution and high optical throughput to allow for accurate measurements of very thin layers. TECHNICAL INSTRUMENT company KMS 310R Ellipsometer is equipped with varied optical tools, like a laser beam mode, to enable samples to be measured accurately in different media, such as water. KMS 310R Ellipsometer includes software editing and statistical evaluation functions that enable complex and accurate measurements. The software features high performance computing modes, enabling quick measurements for many samples within a single acquisition run. TECHNICAL INSTRUMENT company KMS 310R Ellipsometer also has several advanced calibration features to increase the accuracy of the data and results. KMS 310R Ellipsometer is an easy to use instrument, providing users with an easy to learn and intuitive graphical user interface. It has a range of helpful features, like automatic operation, software calibration and user-friendly menu options. The instrument uses an advanced mathematical model to interpret the waveplate-simulated data to provide fast and accurate results. TECHNICAL INSTRUMENT company KMS 310R Ellipsometer is a reliable and powerful instrument, offering high sensitivity and accuracy in the measurements of very thin layers and films. It is a great choice for any applications requiring precise measurements of ultra thin layers and surfaces, such as in photovoltaics and semiconductor industries.