Used ULVAC UNECS-FP-1850 #9314578 for sale

ULVAC UNECS-FP-1850 is an ellipsometer designed for measuring thin film thickness and optical constants. It is a versatile, high precision equipment for analyzing films and materials in the fields of semiconductor fabrication, hard disk drive, photovoltaic cell, and touch panel from 1nm to 32µm. The automated measurement system offers a wide range of sample sizes ranging from 1mm to 13mm diameter. The unit includes an incident laser source, which provides a monochromatic and collimated beam of light. The incident beam is then modulated with a combination of polarizers and then focus into a sample area via a microscope. After passing through the sample layer, the beam is then sent to a CCD camera, which is used to measure the changes in ellipsometric parameters due to interference in the sample layers. The machine has an automated sample loading station which simplifies handling of various samples sizes and increases throughput. The tool includes angle of incidence asset lock and angle of incidence quenching, providing robust performance in analysis of samples at multiple angles of incidence. The RMS accuracy of the model is down to 0.00003 radians, providing a high level of measurement consistency. The advanced software provided with the equipment allows for easy data processing and data analysis. The visual data display includes an interactive ribbon interface. The user can choose what type of (ellipsometric) data is displayed dynamically. The software also includes a variety of analysis tools such as Thickness Vs. Time, Spectral Analysis, Refractive Index, and Table of Enhanced Values. The system is designed with a highly reliable and stable unit that ensures standardized results in a wide temperature range. This is achieved by using a temperature controlled optical element and a pressure seal. The operation is further simplified with an intuitive touch panel that simplifies data input. In short, UNECS-FP-1850 has many features that make it a uniquely powerful and reliable ellipsometer for thin film and optical measurements. It offers a versatile and convenient machine for quickly and accurately measuring wide range of samples in the fields of semiconductor fabrication, hard disk drive, photovoltaic cell, and touch panel. With its advanced software and automated measurement tool, the asset enables easy, efficient, and accurate measurement of samples.