Used RAYTHEON HB76109 #9148161 for sale

RAYTHEON HB76109 is a mask & wafer inspection equipment designed for precise inspection of masks and wafers. It utilizes a high-resolution charge coupled device (CCD) to clearly identify defects. The system provides features such as visualization, alignment, focus, contrast, magnification, and automated defect detection. The inspection is carried out by a 5 megapixel (MP) CCD camera, which provides a wide range of resolution options including 4K, 8K, 16K, 32K, and 64K. The unit has a scan speed of 6 Mpixels/sec, making it suitable for high-speed inspection processes. With its high sensitivity and deep depth of field, the machine provides sharp image quality with low noise levels. The inspection tool includes a manual or automated alignment asset. This allows the model to recognize the part to be inspected and then to align it accurately with the image of the part. Further alignment adjustments can be made to correct errors or for greater precision if required. The focus and contrast modes provide easy, adjustable focus control as well as precise contrast control. The equipment also incorporates a magnification system that allows for an increase in size of the image up to 8X. Additionally, it also has automated defect detection capabilities with a number of features including area map detection, pixel count, length measurement, signed intensity count, and radius inspection. The unit can be interfaced with a computer for easy data transfer and analysis. The machine includes software for data analysis which allows data to be processed, interpreted, and visualized. Further features such as defect map generation and a wide voltage range can be utilized through the software. HB76109 mask & wafer inspection tool is an ideal solution for critical inspection of masks and wafers. Its high resolution, wide range of magnification, and automated defect detection capabilities make it an invaluable tool for manufacturers who require excellent image quality for inspection purposes.